Application of plate vibration and DSPI in evaluation of elastic modulusKUMAR, Rajesh; SHAKHER, Chandra.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550U.1-71550U.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Hardware Based Error compensation in 3D Optical Metrology SystemsHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715505.1-715505.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Infrared of thin film graphene in a magnetic field and the Hall effectSHRIVASTAVA, Keshav N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71552F.1-71552F.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Characterization of optical surfaces for the present generations of synchrotron sourcesTHOMASSET, M; POLACK, F.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715506.1-715506.12, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Phase Shift Polarimetry for non-invasive detection of laser-induced damageWANG PIN; ASUNDI, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715511.1-715511.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Speckle Noise Suppression in Shape and Deformation Measurements by Phase-shifting Digital HolographyYAMAGUCHI, Ichirou.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551D.1-71551D.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Ninth International Symposium on Laser Metrology (30 June - 2 July 2008, Singapore)Quan, Chenggen; Asundi, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2 vol, 2, isbn 978-0-8194-7398-1 0-8194-7398-7Conference Proceedings

A Cube Splitter Interferometer for Phase Shifting Interferometry and Birefringence AnalysisBHATTACHARVA, K; GHOSH, N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551B.1-71551B.5, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Enhanced Resolution Methods in Shearography and Holography for Time-Average Vibration MeasurementBORZA, D. N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715508.1-715508.11, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Optical Bi-Sensorial Measurement System for Production Control of Extruded ProfilesWECKENMANN, A; BERNSTEIN, J.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551U.1-71551U.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

The comparison of different temporal phase analysis algorithms in optical dynamic measurementMIAO, H; FU, Y.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715518.1-715518.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Comparison of Digital Holographic Microscope and Confocal Microscope methods for characterization of micro-optical diffractive componentsYAN HAO; ASUNDI, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550B.1-71550B.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Experimental Study of Unconveniant Static and Dynamic Deformations of Piezoelectric ActuatorsBORZA, D. N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550F.1-71550F.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Error analysis and compensation of binocular-stereo-vision measurement systemZHANG TAO; GUO JUNJIE.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71552Q.1-71552Q.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Fast auto-focusing based on partial image characteristicsCUI JIWEN; TAN JIUBIN.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550O.1-71550O.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Precision optical metrology for MEMSPRYPUTNIEWICZ, Ryszard J.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551S.1-71551S.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Ultra-thin film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR)BURKI, Ibrahim; RIVAS, Cristian.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71552E.1-71552E.11, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Fast wavefront estimation using multiple directional derivatives and quadrature transformLEGARDA-SAENZ, Ricardo.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715531.1-715531.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Some answers to new challenges in optical metrologyOSTEN, W.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, Part I, 715503.1-715503.16, 2Conference Paper

A multipoint diffraction strain sensor using micro-lens array : review on variable sensitivityWANE, J; ASUNDI, Anand K.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551R.1-71551R.6, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

A radial in-plane DSPI interferometer using diffractive optics for residual stresses measurementALBERTAZZI G, Armando JR; VIOTTI, Matias R; KAPP, Walter A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715525.1-715525.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Active alignment and reliable pigtailing of laser diode transmitterFADHALI, M; SAKTIOTO; ZAINAL, J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715520.1-715520.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Complete deformation analysis of transparent samples using digital shearography and holographyCATALAN, Francesca Celine I; SANTOS, Raphael D; ALMORO, Percival F et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715536.1-715536.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

High throughput measurement techniques for wafer level yield inspection of MEMS devicesVARELA PEDREIRA, O; LAUWAGIE, T; DE COSTER, J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550M.1-71550M.11, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Measurement of temperature field in steady laminar free convection flow using digital holographySHAKHER, Chandra; MOSARRAF HOSSAIN, Md; DALIP SINGH MEHTA et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551X.1-71551X.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper